Join us at the GOM Conference 2017

01. June 2017

Zebicon is attending the 3D Metrology Conference and invites you to come along.

On September 26th-27th, 2017, GOM hosts an international 3D metrology conference. The conference is free of charge and takes place at GOM in Braunschweig, Germany. Here experts, metrologists, and executives from 40 countries will meet to learn about optical measuring technology.

At the conference, speakers from international companies will share their experiences, while GOM will present the latest trends and new developments in 3D scanning technologies and software.

An opportunity to gain insight into optical measuring systems
The GOM conference will include a presentation forum on 3D testing and 3D metrology, interactive solution tracks covering industry-specific topics, and a technical exhibition. 

Participants of the conference will have the opportunity to take a guided tour of GOM’s headquarters along with the production of 3D metrology systems. In the evening, there will be networking dinners for direct exchange of experiences.      

Zebicon will be present at the conference on both days and encourages you to participate in this interesting event as well.

Details
Date: September 26-27, 2017
Location: GOM Headquarters, Schmitzstrasse 2, 38122 Braunschweig, Germany
Registration is free of charge.

Read more about GOM Conference 2017 and register now.

Sign up

Contact

Katja Ramsing
Project Manager

+45 4196 4956
kr@zebicon.com